| CPC G02B 6/4255 (2013.01) [G02B 6/4243 (2013.01); G02B 6/4246 (2013.01); H01L 24/16 (2013.01); H01L 24/81 (2013.01); H01L 23/481 (2013.01); H01L 2224/16148 (2013.01); H01L 2224/81815 (2013.01)] | 20 Claims |

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1. A semiconductor device comprising:
a photonic integrated circuit die comprising a groove;
a die electrically connected to the photonic integrated circuit die;
a dam located over the photonic integrated circuit die and adjacent to the die; and
an encapsulant extending from the dam to the die, wherein the encapsulant is located between the dam and the die in a direction parallel with a major surface of the die.
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