US 12,253,534 B2
Sample analyzer and sample analysis method
Kazuma Moriura, Kobe (JP); and Hiroshi Kurono, Kobe (JP)
Assigned to Sysmex Corporation, Hyogo (JP)
Filed by SYSMEX CORPORATION, Kobe (JP)
Filed on Feb. 25, 2020, as Appl. No. 16/800,172.
Claims priority of application No. 2019-036661 (JP), filed on Feb. 28, 2019.
Prior Publication US 2020/0278363 A1, Sep. 3, 2020
Int. Cl. G01N 35/00 (2006.01); B01L 3/00 (2006.01); B01L 9/00 (2006.01); G01N 35/02 (2006.01)
CPC G01N 35/00732 (2013.01) [B01L 3/50 (2013.01); B01L 9/00 (2013.01); G01N 35/02 (2013.01); B01L 2300/021 (2013.01); B01L 2300/025 (2013.01); B01L 2300/0627 (2013.01)] 9 Claims
OG exemplary drawing
 
1. A sample analysis method comprising:
acquiring production lot information on a production lot of a container for containing a sample;
analyzing the sample using the container discharged through a discharge port included in a storage section configured to store the container, the sample contained in the container during the analyzing;
recording the production lot information, an analysis result of the sample contained in the container, and time information related to time of analyzing the sample; and
generating, based on the recorded information, display information for displaying at least one analysis result of at least one sample analyzed during a predetermined period of time on a display unit in a manner that associates the at least one analysis result with the production lot information.