US 12,253,492 B2
In-process quality assessment for additive manufacturing
Neil J Goldfine, Cocoa Beach, FL (US); and Todd M Dunford, Amherst, MA (US)
Assigned to JENTEK Sensors, Inc., Marlborough, MA (US)
Filed by JENTEK Sensors, Inc., Marlborough, MA (US)
Filed on Sep. 1, 2023, as Appl. No. 18/459,641.
Application 18/459,641 is a continuation of application No. 18/092,422, filed on Jan. 2, 2023, granted, now 11,747,304.
Application 18/092,422 is a continuation of application No. 17/653,024, filed on Mar. 1, 2022, granted, now 11,543,388, issued on Jan. 3, 2023.
Application 17/653,024 is a continuation of application No. 15/796,351, filed on Oct. 27, 2017, granted, now 11,268,933, issued on Mar. 8, 2022.
Claims priority of provisional application 62/471,447, filed on Mar. 15, 2017.
Claims priority of provisional application 62/413,862, filed on Oct. 27, 2016.
Prior Publication US 2023/0408449 A1, Dec. 21, 2023
Int. Cl. G01N 27/9013 (2021.01); B22F 10/20 (2021.01); B22F 10/28 (2021.01); B22F 10/38 (2021.01); B22F 10/85 (2021.01); B22F 12/49 (2021.01); B22F 12/90 (2021.01); B33Y 10/00 (2015.01); B33Y 30/00 (2015.01); B33Y 50/02 (2015.01); G01N 27/00 (2006.01); G01N 27/90 (2021.01); B22F 10/30 (2021.01)
CPC G01N 27/902 (2013.01) [B22F 10/20 (2021.01); B22F 10/28 (2021.01); B22F 10/38 (2021.01); B22F 10/85 (2021.01); B22F 12/49 (2021.01); B22F 12/90 (2021.01); B33Y 10/00 (2014.12); B33Y 30/00 (2014.12); B33Y 50/02 (2014.12); G01N 27/9046 (2013.01); B22F 10/30 (2021.01); Y02P 10/25 (2015.11)] 11 Claims
OG exemplary drawing
 
1. A method for measuring a property of an additive manufacturing (AM) layer most recently deposited, the method comprising acts of:
moving an eddy current sensor across the AM layer;
measuring with the eddy current sensor the property of a material of the AM layer, wherein measurement of the property is compensated for lift-off of the eddy current sensor from the AM layer; and
determining a condition of the AM layer from the property.