US 12,253,351 B2
Optical palpation device and method for evaluating a mechanical property of a sample material
Brendan Francis Kennedy, Walliston (AU); Qi Fang, Claremont (AU); and Rowan William Sanderson, Subiaco (AU)
Assigned to OncoRes Medical Pty Ltd, Nedlands (AU)
Appl. No. 17/286,555
Filed by OncoRes Medical Pty Ltd, Nedlands (AU)
PCT Filed Oct. 24, 2019, PCT No. PCT/AU2019/051171
§ 371(c)(1), (2) Date Apr. 19, 2021,
PCT Pub. No. WO2020/082133, PCT Pub. Date Apr. 30, 2020.
Claims priority of application No. 2018904043 (AU), filed on Oct. 24, 2018.
Prior Publication US 2021/0381823 A1, Dec. 9, 2021
Int. Cl. G01B 11/16 (2006.01); A61B 3/16 (2006.01); A61B 5/00 (2006.01); A61B 34/30 (2016.01); G01L 1/24 (2006.01); G01N 3/08 (2006.01)
CPC G01B 11/16 (2013.01) [A61B 3/16 (2013.01); A61B 5/0053 (2013.01); A61B 5/6806 (2013.01); A61B 5/6848 (2013.01); A61B 5/6853 (2013.01); A61B 34/30 (2016.02); G01B 11/165 (2013.01); G01L 1/24 (2013.01); G01N 3/08 (2013.01); A61B 2034/301 (2016.02); A61B 2562/0266 (2013.01); G01N 2203/0019 (2013.01); G01N 2203/0641 (2013.01)] 20 Claims
OG exemplary drawing
 
1. An optical palpation device for evaluating a mechanical property of a sample material, the device comprising:
a body having a sensing portion;
a sensing layer positioned at the sensing portion of the body and having a sensing surface positioned for direct or indirect contact with a surface area of the sample material, the sensing layer being deformable and having an optically detectable marker or pattern;
an optical system capable of providing information that can be used to determine a movement of the marker or pattern relative to the optical system and upon deformation of the sensing layer, the information being provided for a plane orthogonal to a direction of propagation of light;
wherein the optical palpation device is arranged such that, when the sensing surface of the sensing layer is in direct or indirect contact with the surface area of the sample material and a pressure is applied across both the sensing layer and at least a portion of the surface area of the sample material, the sensing layer is deformed and information concerning the mechanical property of the sample material can be provided by measuring a change in position of the marker or pattern relative to the optical system;
wherein the optical system comprises a stereoscopic camera; and
wherein the marker or pattern is at least one of:
(i) intrinsic to the sensing layer; and
(ii) illuminated by a light source projecting a light.