US 12,251,840 B2
Force control parameter adjustment method and force control parameter adjustment apparatus
Yasuhiro Shimodaira, Matsumoto (JP)
Assigned to SEIKO EPSON CORPORATION, (JP)
Filed by SEIKO EPSON CORPORATION, Tokyo (JP)
Filed on Jun. 23, 2022, as Appl. No. 17/847,561.
Claims priority of application No. 2021-104753 (JP), filed on Jun. 24, 2021.
Prior Publication US 2022/0410384 A1, Dec. 29, 2022
Int. Cl. B25J 9/16 (2006.01); B25J 13/08 (2006.01)
CPC B25J 9/1633 (2013.01) [B25J 9/1651 (2013.01); B25J 9/1653 (2013.01); B25J 13/085 (2013.01)] 6 Claims
OG exemplary drawing
 
1. A method for adjusting one or more force control parameters used in force control performed by a robot system,
the robot system including a robot and a force detector configured to measure an external force exerted on the robot,
the adjustment method for causing a processor to execute a process, the method comprising executing on the processor the steps of:
a measurement step of producing measured force information of the external force by causing the robot to perform an action using one or more second servo gains used to adjust the force control parameters corresponding to one or more first servo gains when the robot system is caused to perform a task which is different from the adjustment of the force control parameters, the second servo gains each having a value greater than a value of the corresponding first servo gain, and further using a candidate value of the force control parameters, the measured force information including an action period of time during which the action is performed, a maximum detected force value of the external force, and a maximum detected torque value of the external force;
a parameter update step of producing a new candidate value of the force control parameters by carrying out an optimization process on the force control parameters by using the measured force information; and
a parameter determination step of determining the force control parameters used in the force control performed by the robot system by repeating the measurement step and the parameter update step.