US 11,929,001 B2
Method and device for measuring illuminance
Jongah Kim, Suwon-si (KR); Kyusung Kim, Suwon-si (KR); Jeongho Cho, Suwon-si (KR); Heewoong Yoon, Suwon-si (KR); Kihyuk Lee, Suwon-si (KR); Donghan Lee, Suwon-si (KR); and Gwangho Choi, Suwon-si (KR)
Assigned to Samsung Electronics Co., Ltd., Suwon-si (KR)
Filed by Samsung Electronics Co., Ltd., Suwon-si (KR)
Filed on Jan. 26, 2023, as Appl. No. 18/159,959.
Application 18/159,959 is a continuation of application No. PCT/KR2021/006732, filed on May 31, 2021.
Claims priority of application No. 10-2020-0097009 (KR), filed on Aug. 3, 2020.
Prior Publication US 2023/0169903 A1, Jun. 1, 2023
Int. Cl. G09G 3/20 (2006.01); G01J 1/18 (2006.01); G01J 1/42 (2006.01); G09G 3/00 (2006.01); G09G 3/34 (2006.01); G09G 5/00 (2006.01); G09G 5/10 (2006.01)
CPC G09G 3/20 (2013.01) [G01J 1/4204 (2013.01); G09G 2320/0626 (2013.01); G09G 2330/021 (2013.01); G09G 2360/144 (2013.01); G09G 2360/16 (2013.01)] 20 Claims
OG exemplary drawing
 
1. An electronic device comprising:
a light-measuring sensor;
a display;
a memory; and
at least one processor operatively connected to the light-measuring sensor, the display, and the memory,
wherein the at least one processor is configured to:
analyze a frequency of an external light source,
obtain an operation period of the display,
obtain a ratio of an off period of time of the display, based on the operation period, and
calculate illuminance using different algorithms, based on the ratio of an off period of time of the display and a relationship between the frequency of the external light source and the operation period.