US 11,927,520 B2
Rotating levitated particle imaging
Viktor Shkolnikov, Palo Alto, CA (US); Daixi Xin, Palo Alto, CA (US); and Yang Lei, Palo Alto, CA (US)
Assigned to Hewlett-Packard Development Company, L.P., Spring, TX (US)
Appl. No. 17/415,130
Filed by Hewlett-Packard Development Company, L.P., Spring, TX (US)
PCT Filed May 30, 2019, PCT No. PCT/US2019/034757
§ 371(c)(1), (2) Date Jun. 17, 2021,
PCT Pub. No. WO2020/242486, PCT Pub. Date Dec. 20, 2020.
Prior Publication US 2022/0074843 A1, Mar. 10, 2022
Int. Cl. G01N 15/10 (2006.01); G01N 15/00 (2006.01)
CPC G01N 15/1031 (2013.01) [G01N 15/0227 (2013.01); G01N 2015/0053 (2013.01)] 14 Claims
OG exemplary drawing
 
1. A particle monitoring system comprising:
a flow passage;
a particle imager to image a targeted particle within the flow passage;
electrodes supported proximate the flow passage;
a power source connected to the electrodes; and
a controller to cause the power source to charge the electrodes so as to (1) apply an electric field balanced with respect to gravity so as to hold, levitate and rotate a targeted particle within the flow passage during imaging and (2) release the targeted particle following the imaging,
wherein the flow passage comprises a floor and a ceiling, wherein the controller is to charge the electrodes to hold, levitate and rotate the targeted particle in a first zone spaced from and between the floor and the ceiling while allowing non-targeted particles to flow past the targeted particle through a second zone between the floor and the ceiling.