US 12,250,364 B2
Testing device and testing method for detecting stitching defect of panoramic camera
Chieh-Cheng Liao, Hsinchu (TW)
Assigned to ASPEED Technology Inc., Hsinchu (TW)
Filed by ASPEED Technology Inc., Hsinchu (TW)
Filed on Jan. 16, 2022, as Appl. No. 17/577,000.
Claims priority of application No. 110143880 (TW), filed on Nov. 25, 2021.
Prior Publication US 2023/0164306 A1, May 25, 2023
Int. Cl. H04N 17/00 (2006.01); G06T 5/30 (2006.01); G06T 5/70 (2024.01); G06T 7/00 (2017.01); H04N 23/56 (2023.01); H04N 23/698 (2023.01)
CPC H04N 17/002 (2013.01) [G06T 5/30 (2013.01); G06T 5/70 (2024.01); G06T 7/0002 (2013.01); H04N 23/698 (2023.01); G06T 2207/20036 (2013.01); G06T 2207/30168 (2013.01); H04N 23/56 (2023.01)] 20 Claims
OG exemplary drawing
 
1. A testing device for detecting a stitching defect of a panoramic camera, comprising:
a chart, comprising a plurality of black stripes and a plurality of white stripes, and configured to be captured by the panoramic camera;
a transceiver, communicatively connected to the panoramic camera; and
a processor, coupled to the transceiver, wherein the processor is configured to:
access the panoramic camera through the transceiver to obtain a stitched image corresponding to the captured chart, wherein the stitched image comprises a chart image corresponding to the chart;
generate a defect image marked with the stitching defect according to the chart image;
output the defect image through the transceiver;
obtain a defect parameter according to the defect image; and
output the defect parameter through the transceiver.