US 12,249,943 B2
Control device
Yuta Nakamura, Utsunomiya (JP); Masatoshi Goto, Shimotsuke (JP); Yoshinori Sagiya, Shimotsuke (JP); Kazunari Kurokawa, Oyama (JP); Shugo Ueno, Utsunomiya (JP); and Shintaro Tai, Utsunomiya (JP)
Assigned to HITACHI ASTEMO, LTD., Hitachinaka (JP)
Filed by Hitachi Astemo, Ltd., Hitachinaka (JP)
Filed on Dec. 2, 2021, as Appl. No. 17/540,595.
Claims priority of application No. 2020-201949 (JP), filed on Dec. 4, 2020.
Prior Publication US 2022/0182006 A1, Jun. 9, 2022
Int. Cl. H02P 27/06 (2006.01); H02M 1/32 (2007.01); H02P 29/024 (2016.01); H02P 29/028 (2016.01); H02P 29/68 (2016.01)
CPC H02P 29/028 (2013.01) [H02M 1/325 (2021.05); H02P 27/06 (2013.01); H02P 29/027 (2013.01); H02M 1/327 (2021.05); H02P 29/68 (2016.02)] 14 Claims
OG exemplary drawing
 
1. A control device in which a plurality of switching legs including a pair of semiconductor switching elements constituting an upper arm and a lower arm are provided in a number corresponding to the number of phases of a motor that is a load, the control device comprising:
a switch short circuit detection unit configured to monitor a state of a current flowing to a semiconductor switching element of the pair of the semiconductor switching elements and detect a short circuit failure of a remaining semiconductor switching element of the pair of the semiconductor switching elements; and
a control unit configured to execute determination processing of determining whether the short circuit failure has occurred in the upper arm or the lower arm as a short circuit polarity on the basis of a result of detection by the switch short circuit detection unit, and to set all the semiconductor switching elements that constitute an arm in which the short circuit failure has occurred on the basis of a result of the determination processing to be in an ON state,
wherein, when all the semiconductor switching elements are already set to be in an ON state, the control unit determines whether an elapsed time since all the elements were set to be in the ON state is within a predetermined time threshold value, determines whether an arm whose semiconductor switching elements are all set to be in the ON state matches a result of the determination processing when the elapsed time is within the time threshold value, and switches the arm whose semiconductor switching elements are all set to be in the ON state when the arm does not match the result of the determination processing.