US 12,249,375 B2
Memory device and method of operating the same
Dong Jun Kim, Icheon-si (KR); Hea Jong Yang, Icheon-si (KR); Jong Wook Kim, Icheon-si (KR); Pyung Hwa Kim, Icheon-si (KR); and Yong Hwan Jang, Icheon-si (KR)
Assigned to SK hynix Inc., Icheon-si (KR)
Filed by SK hynix Inc., Icheon-si (KR)
Filed on Nov. 25, 2022, as Appl. No. 17/994,061.
Claims priority of application No. 10-2022-0087243 (KR), filed on Jul. 15, 2022.
Prior Publication US 2024/0021245 A1, Jan. 18, 2024
Int. Cl. G11C 16/04 (2006.01); G11C 16/20 (2006.01); G11C 16/24 (2006.01); G11C 16/30 (2006.01)
CPC G11C 16/0433 (2013.01) [G11C 16/20 (2013.01); G11C 16/24 (2013.01); G11C 16/30 (2013.01)] 27 Claims
OG exemplary drawing
 
1. A memory device, comprising:
a string including select transistors and memory cells coupled in series between a bit line and a source line;
a voltage generation circuit configured to:
provide a turn-on voltage or a turn-off voltage to select lines coupled to the select transistors; and
provide at least one operating voltage to word lines coupled to the memory cells, or discharge the select lines or the word lines;
a page buffer configured to precharge or discharge the bit line, wherein when the select transistors are turned off in response to the turn-off voltage, the page buffer discharges the bit line; and
a channel initializing circuit configured to control the voltage generation circuit and the page buffer to initialize a channel of the string when an operation performed on the memory cells is completed or is suspended before being completed.