| CPC G06T 7/0004 (2013.01) [G06T 2207/10116 (2013.01); G06T 2207/30148 (2013.01)] | 23 Claims |

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1. A system, comprising:
a first imaging assembly, which comprises an optical microscope, is configured to produce a first image of a measurement site, which comprises a structure produced in a sample comprising a semiconductor substrate;
a second imaging assembly, which comprises an optical camera, is coupled with a measurement assembly and is configured to produce a second image of the measurement site; and
a processor, which is configured to: (i) perform, based on the first image, a first movement of the sample relative to the measurement assembly, (ii) perform, based on the second image, a second movement of the sample for aligning the sample with the measurement assembly, and (iii) control the measurement assembly to perform a measurement in the measurement site.
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