US 12,249,058 B2
Inspection method and inspection machine
Shinya Nakashima, Kyoto (JP)
Assigned to PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD., Osaka (JP)
Filed by Panasonic Intellectual Property Management Co., Ltd., Osaka (JP)
Filed on Jun. 3, 2021, as Appl. No. 17/338,594.
Claims priority of application No. 2020-102355 (JP), filed on Jun. 12, 2020.
Prior Publication US 2021/0390684 A1, Dec. 16, 2021
Int. Cl. G06T 7/00 (2017.01); H04N 23/56 (2023.01)
CPC G06T 7/0004 (2013.01) [G06T 7/97 (2017.01); H04N 23/56 (2023.01); G06T 2207/20221 (2013.01)] 7 Claims
OG exemplary drawing
 
1. An inspection machine that inspects an inspection object by detecting a size of an object in the inspection object, the inspection machine comprising:
a plurality of image sensors that image the inspection object; and
an image processing device that generates an image of the object from outputs of the plurality of image sensors, the outputs being results of imaging by the plurality of image sensors,
wherein the image processing device
generates a plurality of captured images including images of a predetermined range of the inspection object in common in accordance with the outputs of the plurality of image sensors,
extracts at least one image of the object in the inspection object from the plurality of generated captured images,
when there are at least two images of the object extracted by the image processing device:
associates the at least two images extracted by the image processing device with each other based on feature amounts of the object reflected in the images extracted; and
combines, with each other, the at least two images of the object associated by the image processing device, and
when there is only one image of the object extracted by the image processing device, outputs the one image of the object that is not combined with any other image.