US 12,248,390 B2
Lockless log and error reporting for automatic test equipment
Chi Yuan, San Jose, CA (US); and Srdjan Malisic, San Jose, CA (US)
Assigned to Advantest Corporation, Tokyo (JP)
Filed by ADVANTEST CORPORATION, Tokyo (JP)
Filed on Mar. 30, 2023, as Appl. No. 18/128,931.
Claims priority of provisional application 63/440,373, filed on Jan. 20, 2023.
Claims priority of provisional application 63/429,061, filed on Nov. 30, 2022.
Prior Publication US 2024/0176721 A1, May 30, 2024
Int. Cl. G06F 11/34 (2006.01); G06F 11/07 (2006.01)
CPC G06F 11/3476 (2013.01) [G06F 11/0787 (2013.01)] 20 Claims
OG exemplary drawing
 
1. A method of testing a device under test (DUT), the method comprising:
pre-allocating a log memory of a host device for storing test results of the DUT;
executing a test program to test the DUT; and
during testing of the DUT, issuing a command to access the log memory using an application programming interface (API), wherein the log memory remains unlocked during the testing of the DUT while test result data is being stored in the log memory and while accessing the test result data using the API.