US 12,248,382 B2
Data center environment architecture including system under test component analysis for use when performing test automation orchestration
Vijay Narayana Reddy Halaharvi, Round Rock, TX (US)
Assigned to Dell Products L.P., Round Rock, TX (US)
Filed by Dell Products L.P., Round Rock, TX (US)
Filed on Jan. 24, 2023, as Appl. No. 18/100,943.
Prior Publication US 2024/0248821 A1, Jul. 25, 2024
This patent is subject to a terminal disclaimer.
Int. Cl. G06F 11/22 (2006.01); G06F 11/07 (2006.01)
CPC G06F 11/2294 (2013.01) [G06F 11/0709 (2013.01)] 11 Claims
OG exemplary drawing
 
1. A computer-implementable method for performing a data center management and monitoring operation, comprising:
receiving a plurality of system under test (SUT) test plans, each SUT test plan of the plurality of system under test (SUT) test plans comprising a plurality of SUT test cases, each of the plurality of SUT test cases being associated with a component of a data center asset contained within a data center;
analyzing the plurality of SUT test cases, the analyzing comprising generating a phase component resolution score for each of the plurality of SUT test cases, the phase component resolution score for each of the plurality of SUT test cases providing a second order analysis for prioritizing execution of test cases;
generating a continuous schedule for the plurality of SUT test plans, the generating the continuous schedule for the plurality of SUT test plans taking into account the phase component resolution score for each of the plurality of SUT test cases, the continuous schedule for the plurality of SUT test plans being regularly updated based upon one or both of new priorities and updated constraints;
continuously orchestrating the plurality of SUT test plans based upon the continuous schedule for the plurality of SUT test plans; and,
applying each of the plurality of SUT test cases to the associated component of the data center asset contained within the data center based upon the continuously orchestrating the plurality of SUT test plans; and
wherein the phase component resolution score for each of the plurality of SUT test cases is based upon one or more test case phase scores associated with each of the plurality of SUT test cases;
the one or more test case phase scores associated with each of the plurality of SUT test cases includes a submit to verify phase score and a verify to close phase score, and,
the phase component resolution scores for each of the plurality of SUT test cases for a submit to verify phase and a verify to close phase are combined to generate an overall phase component analysis score.