CPC G02B 21/006 (2013.01) [G02B 21/0048 (2013.01); G02B 21/008 (2013.01); G02B 27/0068 (2013.01)] | 20 Claims |
1. A method for identifying and correcting optical aberrations within a sample under optical microscopy, comprising:
providing a plurality of optical beams including at least a first optical beam and a second optical beam;
modulating at least one of the optical beams at one or more frequencies, the intensity of one of the optical beams being higher than the other;
the first optical beam and the second optical beam being at least partially superimposed in time to provide a combined optical beam;
focusing the combined optical beam into an imaging sample, followed by detecting a first signal excited by the combined optical beam in the sample;
demodulating the first signal by at least one lock-in amplifier to obtain a second signal comprising performing a plurality of measurements of the spatial positions of the first optical beam with respect to the second optical beam; and
obtaining an electric-field point spread function of the optical beams based on the second signal to identify and correct the optical aberrations within the sample.
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