US 12,248,009 B2
Method for determining test signals for electromagnetic susceptibility testing of a device-under-test
Hendrik Bartko, Unterhaching (DE); and Siewleng Ng, Singapore (SG)
Assigned to Rohde & Schwarz GmbH & Co. KG, Munich (DE)
Filed by Rohde & Schwarz GmbH & Co. KG, Munich (DE)
Filed on Mar. 12, 2024, as Appl. No. 18/602,281.
Claims priority of application No. 23170531 (EP), filed on Apr. 28, 2023.
Prior Publication US 2024/0361372 A1, Oct. 31, 2024
Int. Cl. G01R 29/08 (2006.01); G06N 20/00 (2019.01)
CPC G01R 29/0807 (2013.01) [G06N 20/00 (2019.01)] 9 Claims
OG exemplary drawing
 
1. A method for generating radio frequency, RF, test signals for electromagnetic susceptibility, EMS, testing of a device-under-test, DUT, the method comprising the steps of:
receiving at least one DUT parameter which defines a property of the DUT;
receiving at least one environmental parameter which defines an electromagnetic environment, EME, in which the DUT is to be used;
receiving information on an EM emission behavior;
inputting the at least one DUT parameter, the at least one environmental parameter and the information on the EM emission behavior to a machine learning, ML, or artificial intelligence, AI, model;
wherein the ML or AI model is configured to determine one or more RF test signals for EMS testing of the DUT based on the at least one DUT parameter, the at least one environmental parameter and the information on the EM emission behavior;
generating the one or more RE test signals;
transmitting the one or more RF test signals to the DUT; and
analyzing a response of the DUT to the one or more RF test signals to which the DUT in the EME is expected to be most susceptible.