US 12,247,934 B2
Polarized, energy dispersive x-ray fluorescence system and method
Zewu Chen, Schenectady, NY (US); Fuzhong Wei, Altamont, NY (US); Joseph J. Spinazola, III, Troy, NY (US); Zhifan Gao, Suzhou (CN); and Yaobiao Xia, Schenectady, NY (US)
Assigned to X-RAY OPTICAL SYSTEMS, INC., East Greenbush, NY (US)
Filed by X-RAY OPTICAL SYSTEMS, INC., East Greenbush, NY (US)
Filed on Jul. 29, 2022, as Appl. No. 17/815,953.
Prior Publication US 2024/0035990 A1, Feb. 1, 2024
Int. Cl. G01N 23/223 (2006.01)
CPC G01N 23/223 (2013.01) [G01N 2223/20 (2013.01); G01N 2223/652 (2013.01)] 20 Claims
OG exemplary drawing
 
1. A polarized x-ray fluorescence system comprising:
a titanium x-ray source, the titanium x-ray source comprising a titanium target on which electrons impinge to generate a diverging x-ray beam with a titanium-based characteristic energy;
a focusing, doubly-curved LiF crystal optic to monochromate and focus the diverging x-ray beam from the titanium x-ray source to provide a monochromated and focused x-ray excitation beam directed to impinge on a sample;
wherein the focusing, doubly-curved LiF crystal optic and the titanium x-ray source are positioned relative to each other within the polarized x-ray fluorescence system to polarize the x-ray excitation beam; and
a detector to receive fluorescence from the sample induced by the polarized X-ray excitation beam impinging thereon, the fluorescence being indicative of a concentration of at least one element in the sample, wherein the titanium x-ray source, doubly-curved crystal optic and sample are in a plane, and a center axis of the detector relative to the plane is within an angle to the plane in the range of 85° to 95°.