US 12,247,930 B2
Inspection apparatus and inspection method for display device
Sangjun Seok, Seoul (KR); and Namhyuk Kim, Asan-si (KR)
Assigned to SAMSUNG DISPLAY CO., LTD., Yongin-si (KR)
Filed by Samsung Display Co., LTD., Yongin-si (KR)
Filed on Aug. 16, 2022, as Appl. No. 17/888,694.
Claims priority of application No. 10-2021-0136554 (KR), filed on Oct. 14, 2021.
Prior Publication US 2023/0123595 A1, Apr. 20, 2023
Int. Cl. G01N 21/958 (2006.01); G01N 21/93 (2006.01)
CPC G01N 21/958 (2013.01) [G01N 21/93 (2013.01); G01N 2201/066 (2013.01); G01N 2201/12784 (2013.01)] 11 Claims
OG exemplary drawing
 
1. An inspection apparatus for a display device, comprising:
a light supplier that supplies light to a surface of the display device;
an inspection pattern portion between the display device and the light supplier;
a measurement portion that measures reflected light reflected from the surface of the display device; and
a processing portion that processes data of the reflected light measured by the measurement portion, wherein
the processing portion includes:
a processor;
a calibration data portion including calibration data; and
a calibrator calibrating the data by using the calibration data of the calibration data portion,
the measurement portion includes a camera that detects the reflected light, and
the inspection pattern portion includes:
light-blocking portions arranged to have an interval; and
light-transmitting portions positioned between adjacent ones of the light-blocking portions.