US 12,247,869 B2
Sampling high power beam profiling
Oren Aharon, Haifa (IL)
Assigned to Oren Aharon, Haifa (IL)
Filed by Oren Aharon, Haifa (IL)
Filed on Jul. 19, 2023, as Appl. No. 18/223,583.
Prior Publication US 2025/0027810 A1, Jan. 23, 2025
Int. Cl. G01J 1/42 (2006.01); G01J 1/04 (2006.01)
CPC G01J 1/4257 (2013.01) [G01J 1/0403 (2013.01)] 2 Claims
OG exemplary drawing
 
1. An apparatus for performing very high-power laser measurements using multi-spectral beam profiling, the apparatus comprising:
a beam sampler, mounted on a rotating drum designed to scan the laser beam under examination;
a laser beam profiler that receives the reflected beam from the beam sampler and performs the beam profiling;
an opto-switch for synchronizing the position of the sampler with the acquisition of the beam profile image;
a microcontroller responsible for image processing; and
a cooling air nozzle that directs airflow onto the beam sampler and drives the rotating drum.