US 11,925,029 B2
Semiconductor device
Takamasa Ito, Nagoya (JP); and Hiroshi Matsumoto, Yokkaichi (JP)
Assigned to Kioxia Corporation, Tokyo (JP)
Filed by Kioxia Corporation, Tokyo (JP)
Filed on Dec. 17, 2020, as Appl. No. 17/124,808.
Claims priority of application No. 2020-147055 (JP), filed on Sep. 1, 2020.
Prior Publication US 2022/0068948 A1, Mar. 3, 2022
Int. Cl. H10B 43/50 (2023.01); H10B 43/10 (2023.01); H10B 43/27 (2023.01); H10B 43/40 (2023.01)
CPC H10B 43/50 (2023.02) [H10B 43/10 (2023.02); H10B 43/27 (2023.02); H10B 43/40 (2023.02)] 9 Claims
OG exemplary drawing
 
1. A semiconductor device comprising:
a semiconductor substrate;
a first insulation film provided on the semiconductor substrate;
a first conductive film provided on the first insulation film;
a plurality of first electrode films provided above the first conductive filtn and stacked in a first direction to be apart from each other;
a semiconductor member extending in the first direction in the plurality of first electrode films; and
a charge accumulation member provided between the plurality of first electrode films and the semiconductor member, wherein the first conductive film includes;
a main body arranged below the plurality of first electrode films,
an outer peripheral portion provided in an outer periphery of the main body to be apart from the main body and including a first portion extending in a second direction crossing the first direction,
a protrusion connecting the main body and the outer peripheral portion, extending in a third direction crossing the first direction and the second direction, and divided in the third direction by an insulation member, and
a plurality of first slits and a plurality of second slits alternateiv provided in the second direction along the first portion, respectively extending in the first direction and the second direction in the first portion, being apart from each other in the third direction, and partly overlapping each other in the third direction.