US 11,921,600 B2
Memory system
Katsuya Ohno, Yokohama Kanagawa (JP)
Assigned to Kioxia Corporation, Tokyo (JP)
Filed by KIOXIA CORPORATION, Tokyo (JP)
Filed on Feb. 16, 2021, as Appl. No. 17/177,076.
Claims priority of application No. 2020-080973 (JP), filed on May 1, 2020.
Prior Publication US 2021/0342242 A1, Nov. 4, 2021
Int. Cl. G11C 7/04 (2006.01); G06F 3/06 (2006.01); G06F 11/30 (2006.01); G11C 11/406 (2006.01)
CPC G06F 11/3037 (2013.01) [G06F 3/0614 (2013.01); G06F 3/0653 (2013.01); G06F 3/0688 (2013.01); G06F 11/3058 (2013.01); G06F 11/3075 (2013.01); G11C 7/04 (2013.01); G11C 11/40626 (2013.01)] 18 Claims
OG exemplary drawing
 
1. A memory system comprising:
a nonvolatile semiconductor memory;
a controller configured to control the nonvolatile semiconductor memory; and
a temperature sensor for acquiring an operating temperature of at least one of the nonvolatile semiconductor memory or the controller,
wherein the controller is configured to calculate an average operating temperature of operating temperatures acquired by the temperature sensor over a period of time, and to switch between a plurality of operation settings in which electric power consumptions of the memory system vary, based on the average temperature.