US 11,921,598 B2
Predicting which tests will produce failing results for a set of devices under test based on patterns of an initial set of devices under test
Padmanabha Kannampalli, North Reading, MA (US)
Assigned to Teradyne, Inc., North Reading, MA (US)
Filed by Teradyne, Inc., North Reading, MA (US)
Filed on Oct. 13, 2021, as Appl. No. 17/500,294.
Prior Publication US 2023/0111796 A1, Apr. 13, 2023
Int. Cl. G06F 11/26 (2006.01); G06F 11/22 (2006.01); G06N 20/00 (2019.01); G06F 11/263 (2006.01)
CPC G06F 11/2263 (2013.01) [G06F 11/2268 (2013.01); G06F 11/26 (2013.01); G06N 20/00 (2019.01); G06F 11/2635 (2013.01)] 23 Claims
OG exemplary drawing
 
1. One or more non-transitory machine-readable media storing instructions that are executable by one or more processing devices to perform operations comprising:
obtaining data representing results of tests executed by one or more test instruments on an initial set of devices under test (DUTs) in a test system; and
using the data to train a machine learning model, the machine learning model for predicting which of the tests will produce failing results for a different set of DUTs, where DUTs in the different set have one or more features in common with DUTs in the initial set, and where the machine learning model identifies patterns from results of the initial set of DUTs that are closest to patterns from results of the different set of DUTs to predict which of the tests will produce failing results for the different set of DUTs, and where the patterns from results of the initial set of DUTs and the patterns from results of the different set of DUTs are indicative of passing or failing of the tests executed by the one or more test instruments.