US 11,921,153 B2
Monitoring circuit and semiconductor device
Tae-Pyeong Kim, Gyeonggi-do (KR)
Assigned to SK hynix Inc., Gyeonggi-do (KR)
Filed by SK hynix Inc., Gyeonggi-do (KR)
Filed on Jan. 16, 2023, as Appl. No. 18/097,281.
Application 18/097,281 is a continuation of application No. 17/673,029, filed on Feb. 16, 2022, granted, now 11,579,188.
Application 17/673,029 is a continuation of application No. 16/736,249, filed on Jan. 7, 2020, granted, now 11,287,469, issued on Mar. 29, 2022.
Claims priority of application No. 10-2019-0083760 (KR), filed on Jul. 11, 2019.
Prior Publication US 2023/0204658 A1, Jun. 29, 2023
This patent is subject to a terminal disclaimer.
Int. Cl. G01R 31/28 (2006.01); H01L 21/66 (2006.01); H03K 19/20 (2006.01)
CPC G01R 31/2884 (2013.01) [H01L 22/34 (2013.01); H03K 19/20 (2013.01)] 11 Claims
OG exemplary drawing
 
1. A monitoring circuit for monitoring a semiconductor device in a digital manner, the monitoring circuit comprising:
an oscillation circuit configured to generate an oscillation signal having a rising characteristic or a falling characteristic according to a threshold voltage level; and
a counter configured to count a number of rises or a number of falls of the oscillation signal while a reset signal is in a non-reset state.