US 11,921,060 B2
Sample holder unit for single-crystal X-ray structure analysis apparatus
Takashi Sato, Tokyo (JP)
Assigned to Rigaku Corporation, Tokyo (JP)
Appl. No. 17/295,865
Filed by Rigaku Corporation, Tokyo (JP)
PCT Filed Nov. 21, 2019, PCT No. PCT/JP2019/045702
§ 371(c)(1), (2) Date May 20, 2021,
PCT Pub. No. WO2020/105728, PCT Pub. Date May 28, 2020.
Claims priority of application No. 2018-219782 (JP), filed on Nov. 22, 2018.
Prior Publication US 2021/0396690 A1, Dec. 23, 2021
Int. Cl. G01N 23/20025 (2018.01); G01N 23/205 (2018.01); G01N 23/207 (2018.01)
CPC G01N 23/20025 (2013.01) [G01N 23/205 (2013.01); G01N 23/207 (2013.01)] 16 Claims
OG exemplary drawing
 
1. A sample holder unit comprising a sample holder used in a single-crystal X-ray structure analysis apparatus, and an applicator in which the sample holder is stored,
the sampled holder comprising:
a base part attached to a goniometer in the single-crystal X-ray structure analysis apparatus, the base part formed to have a sample introduction structure into which a sample to be soaked in a porous complex crystal is introduced; and
a holding part that holds the porous complex crystal capable of soaking the sample in a plurality of fine pores formed therein, the holding part formed on the base part, and
the applicator comprising:
an opening and a storing space in which the sample holder is stored, and
a pull-out prevention part that selectively prevents and releases the sample holder stored in the storing space from being pulled out from the opening,
wherein the pull-out prevention part comprises an operation part that releases pull-out prevention thereof in a state where the sample holder stored in the applicator is attached to the goniometer, and
the applicator further comprises a separation mechanism to separate the sample holder therefrom by releasing the pull-out prevention with the operation part.