US 12,244,944 B2
Imaging apparatus and imaging method, camera module, and electronic apparatus capable of detecting a failure in a structure in which substrates are stacked
Takumi Oka, Kanagawa (JP); Atsushi Suzuki, Kanagawa (JP); and Naoki Kawazu, Kanagawa (JP)
Assigned to Sony Semiconductor Solutions Corporation, Kanagawa (JP)
Filed by Sony Semiconductor Solutions Corporation, Kanagawa (JP)
Filed on Oct. 26, 2023, as Appl. No. 18/495,076.
Application 18/495,076 is a continuation of application No. 18/153,017, filed on Jan. 11, 2023, granted, now 11,843,881.
Application 18/153,017 is a continuation of application No. 17/129,553, filed on Dec. 21, 2020, granted, now 11,588,990.
Application 17/129,553 is a continuation of application No. 16/890,800, filed on Jun. 2, 2020, granted, now 11,089,248.
Application 16/890,800 is a continuation of application No. 16/795,446, filed on Feb. 19, 2020, granted, now 11,082,651.
Application 16/795,446 is a continuation of application No. 16/302,906, granted, now 10,659,707, previously published as PCT/JP2017/020369, filed on May 31, 2017.
Claims priority of application No. 2016-109196 (JP), filed on May 31, 2016.
Prior Publication US 2024/0056697 A1, Feb. 15, 2024
This patent is subject to a terminal disclaimer.
Int. Cl. H04N 25/70 (2023.01); H01L 27/146 (2006.01); H04N 25/683 (2023.01); H04N 25/75 (2023.01); H04N 25/766 (2023.01); H04N 25/79 (2023.01)
CPC H04N 25/70 (2023.01) [H01L 27/14618 (2013.01); H01L 27/14634 (2013.01); H01L 27/14636 (2013.01); H04N 25/683 (2023.01); H04N 25/766 (2023.01); H04N 25/79 (2023.01); H04N 25/75 (2023.01)] 15 Claims
OG exemplary drawing
 
1. A light detecting device comprising:
an array of imaging pixels, wherein each imaging pixel comprises a photodiode;
row drive circuitry configured to provide row control signals to the array of imaging pixels; and
a failure detector configured to receive the row control signals from the row drive circuitry and to detect a failure based on the row control signals,
wherein the failure detector is configured to output a high signal in response to detecting no failure, and
wherein the failure detector is configured to output a low signal in response to detecting the failure.