US 12,244,229 B2
Inductor current reconstruction circuit, power converter and inductor current reconstruction method thereof
Chiqing Fang, Hangzhou (CN); Zhiwei Xu, Hangzhou (CN); Kaiwei Yao, Hangzhou (CN); and Chen Zhao, Hangzhou (CN)
Assigned to Silergy Semiconductor Technology (Hangzhou) LTD, Hangzhou (CN)
Filed by Silergy Semiconductor Technology (Hangzhou) LTD, Hangzhou (CN)
Filed on Mar. 22, 2022, as Appl. No. 17/700,705.
Claims priority of application No. 202110319108.7 (CN), filed on Mar. 25, 2021.
Prior Publication US 2022/0311338 A1, Sep. 29, 2022
This patent is subject to a terminal disclaimer.
Int. Cl. H02M 3/158 (2006.01); H02M 1/00 (2006.01)
CPC H02M 3/158 (2013.01) [H02M 1/0009 (2021.05)] 19 Claims
OG exemplary drawing
 
1. An inductor current reconstruction circuit of a power converter, comprising:
a) a switching current sampling circuit configured to acquire at least one of a current flowing through a main power transistor and a current flowing through a rectifier transistor to generate a switching current sampling signal;
b) an inductor current generating circuit configured to generate a reconstruction signal representing an inductor current in one complete switching cycle;
c) wherein the reconstruction signal comprises the switching current sampling signal and a current analog signal generated according to the switching current sampling signal and an inductor voltage signal representing a voltage across an inductor in the power converter;
d) wherein a conduction time interval of a detected transistor comprises a first time interval during which the reconstruction signal is configured as the switching current sampling signal, and a second time interval during which the reconstruction signal is configured as the current analog signal, wherein a start moment of the second time interval is a turn-on moment of the detected transistor, and the second time interval is continuous with the first time interval; and
e) wherein when one of the main power transistor and the rectifier transistor is configured as the detected transistor, the conduction time interval of the detected transistor is greater than the second time interval that is consistent with a blanking time, wherein a first slope signal representing a change rate of the inductor current is obtained according to the switching current sampling signal.