US 12,244,007 B2
Positive electrode active material, secondary battery, and electronic device
Yohei Momma, Kanagawa (JP); Hiroshi Kadoma, Kanagawa (JP); Yoshihiro Komatsu, Kanagawa (JP); Shiori Saga, Kanagawa (JP); and Shunpei Yamazaki, Tokyo (JP)
Assigned to Semiconductor Energy Laboratory Co., Ltd., Atsugi (JP)
Filed by SEMICONDUCTOR ENERGY LABORATORY CO., LTD., Atsugi (JP)
Filed on Mar. 18, 2024, as Appl. No. 18/608,249.
Application 18/608,249 is a continuation of application No. 16/952,189, filed on Nov. 19, 2020, granted, now 11,936,036.
Claims priority of application No. 2019-215105 (JP), filed on Nov. 28, 2019; and application No. 2019-222975 (JP), filed on Dec. 10, 2019.
Prior Publication US 2024/0266515 A1, Aug. 8, 2024
Int. Cl. H01M 4/36 (2006.01); H01M 4/485 (2010.01); H01M 4/525 (2010.01); H01M 4/58 (2010.01); H01M 10/0525 (2010.01); H01M 4/02 (2006.01)
CPC H01M 4/366 (2013.01) [H01M 4/485 (2013.01); H01M 4/525 (2013.01); H01M 4/582 (2013.01); H01M 10/0525 (2013.01); H01M 2004/028 (2013.01)] 13 Claims
OG exemplary drawing
 
1. A positive electrode active material comprising a particle comprising oxygen, cobalt, lithium, magnesium, titanium, nickel, aluminum, and fluorine,
wherein the particle comprises a superficial portion, an inner portion, a depression, and a projection on the superficial portion,
wherein the particle comprises a region where a titanium concentration in the depression is higher than a titanium concentration in the superficial portion,
wherein the particle comprises a region where a titanium concentration in the projection is higher than the titanium concentration in the superficial portion,
wherein the particle comprises a region where a magnesium concentration in the projection is higher than a magnesium concentration in the superficial portion,
wherein the particle comprises a region where a nickel concentration in the projection is higher than a nickel concentration in the superficial portion,
wherein the particle comprises a region where a fluorine concentration in the projection in the projection is higher than a fluorine concentration in the superficial portion, and
wherein the particle comprises a region where an aluminum concentration in the superficial portion is higher than an aluminum concentration in the projection.