| CPC H01L 27/1255 (2013.01) [G09G 3/20 (2013.01); G09G 3/2092 (2013.01); G09G 3/3291 (2013.01); G09G 3/36 (2013.01); G11C 19/184 (2013.01); G11C 19/28 (2013.01); H01L 27/1222 (2013.01); H01L 27/1225 (2013.01); H01L 27/124 (2013.01); H01L 29/7869 (2013.01); H03K 17/161 (2013.01); H03K 19/00315 (2013.01); H03K 19/096 (2013.01); G09G 3/3233 (2013.01); G09G 3/3648 (2013.01); G09G 2300/0439 (2013.01); G09G 2300/08 (2013.01); G09G 2300/0842 (2013.01); G09G 2310/0267 (2013.01); G09G 2310/0275 (2013.01); G09G 2310/0286 (2013.01); G09G 2310/08 (2013.01)] | 11 Claims |

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1. A semiconductor device comprising:
a pixel portion having a first transistor and a light-emitting element electrically connected to the first transistor; and
a drive circuit electrically connected to the pixel portion and having a second transistor,
the first transistor comprises:
a first source electrode layer and a first drain electrode layer;
a first oxide semiconductor layer having regions in contact with top surfaces and side surfaces of the first source electrode layer and the first drain electrode layer; and
a first gate electrode layer over the first oxide semiconductor layer with a first gate insulating layer interposed therebetween,
the second transistor comprises:
a second gate electrode layer;
a second source electrode layer and a second drain electrode layer over the second gate electrode layer;
a second oxide semiconductor layer having regions in contact with top surfaces and side surfaces of the second source electrode layer and the second drain electrode layer; and
a third gate electrode layer over the second oxide semiconductor layer with a second gate insulating layer interposed therebetween,
wherein the first oxide semiconductor layer and the second oxide semiconductor layer each comprise indium, gallium, and zinc.
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