| CPC H01L 23/5286 (2013.01) [H01L 21/823871 (2013.01); H01L 23/5226 (2013.01); H01L 23/552 (2013.01); H01L 27/092 (2013.01); H01L 29/41725 (2013.01)] | 20 Claims |

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1. A method, comprising:
forming a first transistor stack over a substrate, the first transistor stack comprising:
a first transistor of a first conductivity type; and
a second transistor of a second conductivity type different from the first conductivity type, the second transistor above the first transistor; and
forming a plurality of first conductive lines in a first metal layer above the first transistor stack, the plurality of first conductive lines comprising, over the first transistor stack:
a power conductive line configured to route power to the first transistor stack;
one or more signal conductive lines configured to route one or more signals to the first transistor stack; and
a shielding conductive line configured to shield the routed one or more signals on the one or more signal conductive lines, wherein the one or more signal conductive lines are between the power conductive line and the shielding conductive line.
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