US 12,243,613 B2
Voltage output test circuit, voltage divider output circuit, and memory
Chan Chen, Hefei (CN); and Anping Qiu, Hefei (CN)
Assigned to Changxin Memory Technologies, Inc., Hefei (CN)
Filed by Changxin Memory Technologies, Inc., Anhui (CN)
Filed on Sep. 29, 2022, as Appl. No. 17/955,865.
Application 17/955,865 is a continuation of application No. PCT/CN2022/098103, filed on Jun. 10, 2022.
Claims priority of application No. 202210173837.0 (CN), filed on Feb. 24, 2022.
Prior Publication US 2023/0267967 A1, Aug. 24, 2023
Int. Cl. G11C 5/14 (2006.01); G01R 15/04 (2006.01); G05F 1/614 (2006.01)
CPC G11C 5/147 (2013.01) [G01R 15/04 (2013.01); G05F 1/614 (2013.01)] 18 Claims
OG exemplary drawing
 
1. A voltage output test circuit, comprising:
a first voltage divider unit, comprising a first terminal and a second terminal, wherein the first terminal of the first voltage divider unit is connected to a test power supply, and the second terminal of the first voltage divider unit is connected to an output terminal;
a second voltage divider unit, comprising a first terminal and a second terminal, wherein the first terminal of the second voltage divider unit is connected to a ground, and the second terminal of the second voltage divider unit is connected to the output terminal; and
a third voltage divider unit, configured to adjust a resistance between the output terminal and the ground, wherein the third voltage divider unit comprises a first terminal and a second terminal, the first terminal of the third voltage divider unit is connected to the ground, the second terminal of the third voltage divider unit is connected to the output terminal, a resistance of the third voltage divider unit is less than a resistance of the second voltage divider unit, and either the second voltage divider unit or the third voltage divider unit is connected to the output terminal.