US 12,243,611 B2
Detecting laser-injected faults
Minki Cho, Portland, OR (US); Daniel Nemiroff, El Dorado Hills, CA (US); Carlos Tokunaga, Beaverton, OR (US); James W. Tschanz, Portland, OR (US); Kah Meng Yeem, Folsom, CA (US); and Yaxin Shui, San Diego, CA (US)
Assigned to Intel Corporation, Santa Clara, CA (US)
Filed by Intel Corporation, Santa Clara, CA (US)
Filed on Jul. 1, 2022, as Appl. No. 17/856,897.
Prior Publication US 2024/0005962 A1, Jan. 4, 2024
Int. Cl. G11C 5/00 (2006.01)
CPC G11C 5/005 (2013.01) 20 Claims
OG exemplary drawing
 
1. An integrated circuit (IC) die comprising:
a sensor comprising:
a pulse generator comprising gate circuits coupled to each other in an in-series arrangement, wherein an input of the pulse generator is coupled to receive a voltage, the pulse generator to generate a first signal based on the voltage, wherein the pulse generator is to generate a first pulse of the first signal in response to an event wherein radiation from a laser is incident upon the pulse generator; and
a pulse expander coupled to receive the first signal from the pulse generator, the pulse expander to generate a second pulse off of the first pulse, the first pulse having a first pulse width, the second pulse having a wider pulse width than the first pulse width.