| CPC G11C 29/12015 (2013.01) [G01R 31/318594 (2013.01); G01R 31/318597 (2013.01); G11C 29/022 (2013.01); G11C 29/023 (2013.01); G11C 29/10 (2013.01); G11C 29/1201 (2013.01); G11C 29/14 (2013.01); G11C 29/16 (2013.01); G11C 29/26 (2013.01); G11C 29/32 (2013.01); G11C 29/36 (2013.01)] | 21 Claims |

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1. A method comprising:
providing a test sequence to a first input of a first multiplexer, the first multiplexer comprising a second input coupled to an output of a functional memory interface circuit, an output coupled to a first memory, and a selection input;
controlling the selection input of the first multiplexer with a mode control circuit that comprises a second multiplexer having an output coupled to the selection input of the first multiplexer, a first input coupled to an output of a first flip-flop, and a second input coupled to an output of a second flip-flop;
during a built-in-self-test (BIST) mode,
controlling the selection input of the first multiplexer with the output of the first flip-flop, and
providing a clock signal with a clock control circuit with a slow-speed; and
during a functional test mode,
controlling the selection input of the first multiplexer with the output of the second flip-flop, and
providing the clock signal with the clock control circuit with a fast-speed that is faster than the slow-speed.
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