US 12,243,457 B2
Apparatus and method for defect inspection of display panel
Min-Hong Kim, Gyeonggi-do (KR); Taejoon Kim, Seongnam-si (KR); Jungmok Park, Hwaseong-si (KR); Bogeun Yuk, Hwaseong-si (KR); and Hyun-Wook Cho, Yongin-si (KR)
Assigned to SAMSUNG DISPLAY CO., LTD., Yongin-si (KR)
Filed by SAMSUNG DISPLAY CO., LTD., Yongin-si (KR)
Filed on Jan. 6, 2023, as Appl. No. 18/150,931.
Claims priority of application No. 10-2022-0039295 (KR), filed on Mar. 30, 2022.
Prior Publication US 2023/0316968 A1, Oct. 5, 2023
Int. Cl. G01R 31/26 (2020.01); G09G 3/00 (2006.01)
CPC G09G 3/006 (2013.01) [G09G 2330/12 (2013.01)] 20 Claims
OG exemplary drawing
 
1. An apparatus for inspecting a defect of a display panel, comprising:
the display panel configured to display an image;
an input sensor disposed on the display panel and configured to sense an input applied from outside;
a sensor driving part configured to drive the input sensor; and
an inspection part connected with the sensor driving part, and configured to set a frequency of the input sensor to an inspection frequency and to detect the defect of the display panel based on a change in a jitter occurring when the input sensor is driven at the inspection frequency,
wherein the inspection frequency includes a harmonic frequency of a driving frequency of the display panel.