US 12,242,722 B2
Underfill detection for memory systems
Tomer Eliash, Sunnyvale, CA (US); and Sead Zildzic, Jr., Folsom, CA (US)
Assigned to Micron Technology, Inc., Boise, ID (US)
Filed by Micron Technology, Inc., Boise, ID (US)
Filed on Jul. 12, 2023, as Appl. No. 18/221,141.
Claims priority of provisional application 63/389,620, filed on Jul. 15, 2022.
Prior Publication US 2024/0020002 A1, Jan. 18, 2024
Int. Cl. G06F 3/06 (2006.01)
CPC G06F 3/0604 (2013.01) [G06F 3/0619 (2013.01); G06F 3/0653 (2013.01); G06F 3/0679 (2013.01)] 20 Claims
OG exemplary drawing
 
1. A system comprising:
first and second sets of memory components of a memory sub-system, each of the first and second sets of memory components configured to store information according to a first memory storage process and a second memory storage process; and
a processing device operatively coupled to the first and second sets of memory components, the processing device being configured to perform operations comprising:
storing a set of data in the first set of memory components according to the first memory storage process;
storing a pattern of data in the second set of memory components according to the second memory storage process;
computing a data retention parameter for the pattern of data;
determining whether the data retention parameter corresponds to a first physical manufacturing process or a second physical manufacturing process; and
refreshing the pattern of data in response to determining that the data retention parameter corresponds to the first physical manufacturing process;
in response to determining that the data retention parameter corresponds to the second physical manufacturing process, storing the set of data, previously stored according to the first memory storage process in the first set of memory components, according to the second memory storage process.