US 12,242,565 B2
Device analysis apparatus, device analysis method, and storage medium
Takeshi Takeuchi, Tokyo (JP); and Tomoharu Takeuchi, Tokyo (JP)
Assigned to Mitsubishi Electric Corporation, Tokyo (JP)
Appl. No. 18/006,231
Filed by Mitsubishi Electric Corporation, Tokyo (JP)
PCT Filed Sep. 3, 2020, PCT No. PCT/JP2020/033456
§ 371(c)(1), (2) Date Jan. 20, 2023,
PCT Pub. No. WO2022/049701, PCT Pub. Date Mar. 10, 2022.
Prior Publication US 2023/0297644 A1, Sep. 21, 2023
Int. Cl. G06F 17/40 (2006.01); G01M 17/08 (2006.01)
CPC G06F 17/40 (2013.01) [G01M 17/08 (2013.01)] 17 Claims
OG exemplary drawing
 
1. A device analysis apparatus comprising:
an operation data memory to store operation data indicating an operation state of a device;
feature quantity data generation circuitry to generate feature quantity data of the device by using the operation data;
a feature quantity data memory to store the feature quantity data;
first computation circuitry to generate first data indicating behavior of the feature quantity data in units of a term that is set, by using the feature quantity data stored in the feature quantity data storage memory;
second computation circuitry to generate second data indicating behavior of latest feature quantity data by using one or more pieces of the latest feature quantity data newer than the feature quantity data used in generating the first data by the first computation circuitry, among the feature quantity data stored in the feature quantity data memory; and
a display to display one or more pieces of the first data and the second data in one graph.