US 12,242,258 B2
System and method for controlling non-product wafer, storage medium and electronic device
Wei Jiang, Hefei (CN); Ju-Chieh Chung, Hefei (CN); Chien-Chih Chen, Hefei (CN); and Delong Huang, Hefei (CN)
Assigned to CHANGXIN MEMORY TECHNOLOGIES, INC., Hefei (CN)
Filed by CHANGXIN MEMORY TECHNOLOGIES, INC., Hefei (CN)
Filed on Mar. 17, 2022, as Appl. No. 17/655,350.
Claims priority of application No. 202110334261 (CN), filed on Mar. 29, 2021.
Prior Publication US 2022/0308567 A1, Sep. 29, 2022
Int. Cl. G05B 23/02 (2006.01); G05B 19/045 (2006.01)
CPC G05B 23/024 (2013.01) [G05B 19/045 (2013.01); G05B 23/0259 (2013.01)] 18 Claims
OG exemplary drawing
 
1. A method for controlling a non-product wafer, comprising:
monitoring a state of the non-product wafer;
obtaining usage information of the non-product wafer;
receiving a production instruction and controlling the non-product wafer according to the state and the usage information of the non-product wafer;
wherein the monitoring comprises:
analyzing and recording a reason for which the non-product wafer is in the state.