US 12,242,005 B2
Detection of bad detectors at idle state
Inon Berent, Haifa (IL); and David Finzi, Haifa (IL)
Assigned to KONINKLIJKE PHILIPS N.V., Eindhoven (NL)
Appl. No. 17/781,434
Filed by KONINKLIJKE PHILIPS N.V., Eindhoven (NL)
PCT Filed Dec. 13, 2020, PCT No. PCT/EP2020/085874
§ 371(c)(1), (2) Date Jun. 1, 2022,
PCT Pub. No. WO2021/122399, PCT Pub. Date Jun. 24, 2021.
Claims priority of application No. 19216517 (EP), filed on Dec. 16, 2019.
Prior Publication US 2022/0413171 A1, Dec. 29, 2022
Int. Cl. G01T 7/00 (2006.01); G01T 1/20 (2006.01)
CPC G01T 7/00 (2013.01) [G01T 1/2018 (2013.01)] 10 Claims
OG exemplary drawing
 
1. A fault checker system for an X-ray detector, comprising:
an input interface for receiving readings acquired by a target detector pixel not exposed to X-radiation;
a converter configured to perform a conversion operation to convert the readings into a metric; and
a thresholder configured to compare the metric against at least one threshold and, based on the comparing, configured to provide an indication whether the target detector pixel is faulty, wherein the metric is configured to capture noise fluctuation, and wherein the at least one threshold is dynamically adapted.