US 12,241,948 B2
Asymmetric compensation method and apparatus for two-port near field probe, computer device, and storage medium
Weiheng Shao, Guangzhou (CN); Yinghui Chen, Guangzhou (CN); Yiqiang Chen, Guangzhou (CN); and Changjian Zhou, Guangzhou (CN)
Assigned to CHINA ELECTRONIC PRODUCT RELIABILITY AND ENVIRONMENTAL TESTING RESEARCH INSTITUTE (THE FIFTH ELECTRONIC RESEARCH INSTITUTE OF MINISTRY OF INDUSTRY AND INFORMATION TECHNOLOGY) (CEPREI), Guangzhou (CN); and SOUTH CHINA UNIVERSITY OF TECHNOLOGY, Guangzhou (CN)
Filed by CHINA ELECTRONIC PRODUCT RELIABILITY AND ENVIRONMENTAL TESTING RESEARCH INSTITUTE (THE FIFTH ELECTRONIC RESEARCH INSTITUTE OF MINISTRY OF INDUSTRY AND INFORMATION TECHNOLOGY) (CEPREI), Guangzhou (CN); and SOUTH CHINA UNIVERSITY OF TECHNOLOGY, Guangzhou (CN)
Filed on May 6, 2024, as Appl. No. 18/655,857.
Claims priority of application No. 202310652188.7 (CN), filed on Jun. 5, 2023.
Prior Publication US 2024/0402265 A1, Dec. 5, 2024
Int. Cl. G01R 33/025 (2006.01); G01R 27/32 (2006.01); G01R 35/00 (2006.01)
CPC G01R 33/025 (2013.01) [G01R 27/32 (2013.01); G01R 35/005 (2013.01)] 11 Claims
OG exemplary drawing
 
1. An asymmetric compensation method for a two-port near field probe, comprising:
obtaining a first scattering parameter of a symmetric two-port near field probe, wherein the first scattering parameter is collected by a symmetric two-port network, the symmetric two-port network comprises the symmetric two-port near field probe and a vector network analyzer, the symmetric two-port near field probe comprises a second port and a fifth port, the vector network analyzer comprises a first interface, a second interface, a third interface, and a fourth interface, and the second port is connected to the second interface of the vector network analyzer;
obtaining a second scattering parameter of an asymmetric element, wherein the second scattering parameter is collected by an asymmetric two-port network, the asymmetric two-port network comprises the asymmetric element and the vector network analyzer, a third port of the asymmetric element is an output port and is connected to the third interface of the vector network analyzer, and an input port of the asymmetric element is connected to the fifth port of the symmetric two-port near field probe;
obtaining an overall response of a calibration network in a magnetic field environment, wherein the calibration network is established based on the symmetric two-port near field probe and the asymmetric element, the calibration network comprises the vector network analyzer, the symmetric two-port near field probe, the asymmetric element, and a calibrator, a first port and a fourth port arranged at two sides of the calibrator are respectively connected to the first interface and the fourth interface of the vector network analyzer, the second port of the symmetric two-port near field probe is connected to the second interface of the vector network analyzer, the fifth port of the symmetric two-port near field probe is connected to the asymmetric element, and the third port of the asymmetric element is connected to the third interface of the vector network analyzer;
calculating a calibration factor based on the first scattering parameter of the symmetric two-port near field probe, the second scattering parameter of the asymmetric element, and the overall response of the calibration network in the magnetic field environment; and
compensating the symmetric two-port near field probe according to the calibration factor.