US 12,241,928 B2
Electromagnetic wave test device and electromagnetic wave test method
Shotaro Hamamoto, Tokyo (JP); Masataka Midori, Tokyo (JP); and Hiroshi Kurihara, Tokyo (JP)
Assigned to TDK CORPORATION, Tokyo (JP)
Filed by TDK CORPORATION, Tokyo (JP)
Filed on Mar. 14, 2023, as Appl. No. 18/121,091.
Claims priority of application No. 2022-042598 (JP), filed on Mar. 17, 2022.
Prior Publication US 2023/0296665 A1, Sep. 21, 2023
Int. Cl. G01R 31/28 (2006.01)
CPC G01R 31/2862 (2013.01) 22 Claims
OG exemplary drawing
 
1. Electromagnetic wave test device comprising:
a reverberation chamber;
a first antenna installed inside the reverberation chamber and configured to radiate electromagnetic waves of a frequency lower than a first resonance frequency of the reverberation chamber;
a second antenna installed inside the reverberation chamber and configured to radiate electromagnetic waves of a frequency equal to or higher than the first resonance frequency;
a power supply device connected between a member having a ground electric potential and the first antenna and configured to supply power to the first antenna;
a dummy load connected between the member having the ground electric potential and the first antenna;
a first power loss inhibiting unit configured to have an impedance corresponding to an allowed value for power loss according to the first antenna in a case in which electromagnetic waves are radiated from the second antenna; and
a switching unit configured to include a first switching unit that switches a connection destination of the first antenna to one of the dummy load and the first power loss inhibiting unit.