US 12,241,913 B2
Contact probe, probe holder and probe unit
Hajime Arai, Kanagawa (JP); and Kazuya Soma, Kanagawa (JP)
Assigned to NHK Spring Co., Ltd., Yokohama (JP)
Filed by NHK Spring Co., Ltd., Yokohama (JP)
Filed on Jan. 30, 2023, as Appl. No. 18/161,161.
Claims priority of application No. 2022-019667 (JP), filed on Feb. 10, 2022.
Prior Publication US 2023/0251286 A1, Aug. 10, 2023
Int. Cl. G01R 1/067 (2006.01)
CPC G01R 1/06738 (2013.01) [G01R 1/06722 (2013.01)] 10 Claims
OG exemplary drawing
 
1. A contact probe comprising:
a first plunger;
a second plunger; and
a coil spring provided between the first and second plungers and configured to connect the first and second plungers to each other so as to freely advance and retreat,
wherein the first plunger is provided with a groove portion formed on a side surface of the first plunger,
the first plunger includes:
a tip portion including
a main body portion having a columnar shape, and
a contact portion provided at one end of the main body portion and configured to contact a contact target; and
a base end portion provided on a side opposite to the contact portion side of the main body portion and to which a coil spring is connected, and
the groove portion includes a recessed portion extending from one end to the other end of the main body portion in a longitudinal direction,
the contact portion includes a plurality of claw portions arranged in a circumferential direction, and
the groove portion is formed by being provided with the recessed portion at a position corresponding to between the claw portions in a circumferential direction.