US 12,241,737 B2
Three-dimensional-measuring-apparatus inspection gauges, three-dimensional-measuring-apparatus inspection methods and three-dimensional measuring apparatuses
Yuto Inoue, Kanagawa (JP); and Masayuki Nara, Kanagawa (JP)
Assigned to MITUTOYO CORPORATION, Kanagawa (JP)
Filed by MITUTOYO CORPORATION, Kanagawa (JP)
Filed on Oct. 27, 2022, as Appl. No. 17/974,698.
Claims priority of application No. 2021-177083 (JP), filed on Oct. 29, 2021.
Prior Publication US 2023/0136366 A1, May 4, 2023
Int. Cl. G01B 5/008 (2006.01); G01B 5/012 (2006.01); G01B 21/04 (2006.01)
CPC G01B 5/012 (2013.01) [G01B 21/042 (2013.01); G01B 21/047 (2013.01)] 13 Claims
OG exemplary drawing
 
1. A three-dimensional-measuring-apparatus inspection gauge comprising:
a plurality of targets to be measured with which a tip of a probe of a three-dimensional measuring apparatus comes into contact; and
a frame member that supports the plurality of targets, wherein
the plurality of targets are arranged in positions corresponding to each vertex of a triangular prism.