US 12,240,747 B2
Particle extraction apparatus and particle extraction method
Tatsuo Shimizu, Chiba (JP); Kazuya Takahashi, Kanagawa (JP); and Yu Hirono, Tokyo (JP)
Assigned to Sony Group Corporation, Tokyo (JP)
Filed by Sony Group Corporation, Tokyo (JP)
Filed on Dec. 13, 2021, as Appl. No. 17/548,962.
Application 17/548,962 is a continuation of application No. 16/099,511, granted, now 11,254,557, previously published as PCT/JP2017/006503, filed on Feb. 22, 2017.
Claims priority of application No. 2016-098927 (JP), filed on May 17, 2016.
Prior Publication US 2022/0098027 A1, Mar. 31, 2022
This patent is subject to a terminal disclaimer.
Int. Cl. B81B 1/00 (2006.01); B01L 3/00 (2006.01); G01N 15/10 (2024.01); G01N 15/14 (2024.01); G01N 15/149 (2024.01); G01N 37/00 (2006.01)
CPC B81B 1/006 (2013.01) [B01L 3/502 (2013.01); B81B 1/00 (2013.01); G01N 15/1023 (2024.01); G01N 15/14 (2013.01); G01N 15/1459 (2013.01); G01N 15/1484 (2013.01); G01N 37/00 (2013.01); G01N 2015/1006 (2013.01); G01N 15/149 (2024.01)] 14 Claims
OG exemplary drawing
 
1. A particle extraction apparatus comprising:
a first extraction unit configured to extract, from a whole sample containing a target particle, an extraction sample containing the target particle;
a second extraction unit configured to extract the target particle from the extraction sample; and
a liquid feeding section disposed between the first extraction unit and the second extraction unit, wherein the liquid feeding section includes at least one damper,
wherein each of the first extraction unit and second extraction unit are formed in a microchip and wherein the liquid feeding section further comprises a stirring unit configured to return a particle interval in the extraction sample extracted by the first extraction unit to a random state.