US 11,914,449 B2
Methods and apparatus for characterizing memory devices
Jonathan D. Harms, Boise, ID (US)
Assigned to Micron Technology, Inc., Boise, ID (US)
Filed by Micron Technology, Inc., Boise, ID (US)
Filed on May 9, 2022, as Appl. No. 17/740,130.
Application 17/740,130 is a continuation of application No. 16/276,461, filed on Feb. 14, 2019, granted, now 11,327,551, issued on May 10, 2022.
Prior Publication US 2022/0261062 A1, Aug. 18, 2022
Int. Cl. G06F 1/3234 (2019.01); G06F 1/08 (2006.01); G06F 1/324 (2019.01); G06F 11/34 (2006.01); G06F 11/30 (2006.01); G06F 11/00 (2006.01); G06F 1/3206 (2019.01)
CPC G06F 1/3275 (2013.01) [G06F 1/08 (2013.01); G06F 1/324 (2013.01); G06F 1/3206 (2013.01); G06F 11/008 (2013.01); G06F 11/3037 (2013.01); G06F 11/3409 (2013.01); G06F 2201/81 (2013.01)] 20 Claims
OG exemplary drawing
 
1. A method, comprising:
characterizing a memory apparatus;
determining a solution density function associated with the memory apparatus, the solution density function representative at least of a probability of finding a valid solution for an application within a solution space;
generating one or more solutions based at least on a characterized rate, the characterized rate based at least on the solution density function;
validating the one or more solutions; and
utilizing the one or more solutions having been validated in association with the application.