US 11,914,129 B2
Background-suppressed STED nanoscope
Taekjip Ha, Baltimore, MD (US); Jong-Chan Lee, Baltimore, MD (US); and Ye Ma, Baltimore, MD (US)
Assigned to The Johns Hopkins University, Baltimore, MD (US)
Appl. No. 17/598,725
Filed by THE JOHNS HOPKINS UNIVERSITY, Baltimore, MD (US)
PCT Filed Mar. 26, 2020, PCT No. PCT/US2020/024982
§ 371(c)(1), (2) Date Sep. 27, 2021,
PCT Pub. No. WO2020/198487, PCT Pub. Date Oct. 1, 2020.
Claims priority of provisional application 62/823,713, filed on Mar. 26, 2019.
Prior Publication US 2022/0187584 A1, Jun. 16, 2022
Int. Cl. G01N 21/64 (2006.01); G02B 21/00 (2006.01); G02B 21/36 (2006.01)
CPC G02B 21/0076 (2013.01) [G01N 21/6458 (2013.01); G02B 21/008 (2013.01); G02B 21/0068 (2013.01); G02B 21/0072 (2013.01); G02B 21/367 (2013.01)] 20 Claims
OG exemplary drawing
 
1. A method of stimulated emission depletion (STED) microscopy using background suppression comprising:
generating from a STED microscope a first image of a specimen and of background noise;
changing the polarization of a beam from the STED microscope and obtaining a second image of the background noise;
subtracting the second image from the first image to eliminate the background noise; and,
generating a revised image of the specimen without the background noise.