US 11,911,768 B2
Test element support
Reiner Stein, Bad Kreuznach (DE); Martin Mertens, Schriesheim (DE); and Werner Heidt, Darmstadt (DE)
Assigned to ROCHE DIAGNOSTICS OPERATIONS, INC., Indianapolis, IN (US)
Filed by Roche Diagnostics Operations, Inc., Indianapolis, IN (US)
Filed on Apr. 10, 2019, as Appl. No. 16/380,195.
Application 16/380,195 is a continuation of application No. PCT/EP2017/076028, filed on Oct. 12, 2017.
Claims priority of application No. 16193896 (EP), filed on Oct. 14, 2016.
Prior Publication US 2019/0232292 A1, Aug. 1, 2019
Int. Cl. B01L 7/04 (2010.01); B01L 9/00 (2006.01); G01N 21/84 (2006.01); G01N 27/327 (2006.01); G01N 33/487 (2006.01); G01N 33/49 (2006.01); H05K 1/02 (2006.01); H05K 1/14 (2006.01); H05K 3/36 (2006.01)
CPC B01L 7/04 (2013.01) [B01L 9/52 (2013.01); G01N 21/84 (2013.01); G01N 27/3271 (2013.01); G01N 33/48707 (2013.01); G01N 33/4905 (2013.01); H05K 1/0212 (2013.01); H05K 1/144 (2013.01); H05K 3/368 (2013.01); B01L 2300/0609 (2013.01); B01L 2300/0663 (2013.01); B01L 2300/08 (2013.01); B01L 2300/1805 (2013.01); B01L 2300/1883 (2013.01); H05K 2201/041 (2013.01); H05K 2201/062 (2013.01); H05K 2201/09063 (2013.01); H05K 2201/10151 (2013.01); H05K 2203/1115 (2013.01)] 16 Claims
OG exemplary drawing
 
1. A test element support, wherein the test element support is configured to bear or to hold up a test element as a separate element, wherein the test element support comprises:
at least one heating element for heating the test element for analytical examination of a sample,
the heating element having a substrate, the substrate being made of at least one substrate material, the substrate comprising at least one active area configured for being heated and at least one non-active area outside the active area,
the active area and the non-active area being separated by at least one thermal insulation element, wherein the thermal insulation element has a lower thermal conductivity than the substrate material, wherein the thermal insulation element is fully or partially embedded into the substrate; and
at least one heater, wherein the heater comprises at least one heater substrate, wherein the heater substrate is attached to the substrate, wherein the heater substrate is attached to a back face of the substrate, the back face opposing a front face of the substrate configured for contacting the test element, and wherein the active area of the heating element forms an integrated heating surface of the test element support.