US 12,237,147 B2
Methods and systems for event modulated electron microscopy
Bryan Walter Reed, San Leandro, CA (US); and Lewys Jones, Dublin (IE)
Assigned to INTEGRATED DYNAMIC ELECTRON SOLUTIONS, INC., Pleasanton, CA (US); and THE PROVOST, FELLOWS, FOUNDATION SCHOLARS, AND THE OTHER MEMBERS OF BOARD, OF THE COLLEGE OF THE HOLY AND UNDIVIDED TRINITY OF QUEEN ELIZABETH NEAR DUBLIN, Dublin (IE)
Filed by Integrated Dynamic Electron Solutions, Inc., Pleasanton, CA (US); and The Provost, Fellows, Foundation Scholars, and the other members of Board, of the College of the Holy and Undivided Trinity of Queen Elizabeth near Dublin, Dublin (IE)
Filed on Oct. 24, 2023, as Appl. No. 18/383,422.
Application 18/383,422 is a continuation of application No. 18/104,101, filed on Jan. 31, 2023, granted, now 11,848,173.
Prior Publication US 2024/0355581 A1, Oct. 24, 2024
Int. Cl. H01J 37/28 (2006.01); H01J 37/147 (2006.01); H01J 37/22 (2006.01); H01J 37/244 (2006.01)
CPC H01J 37/28 (2013.01) [H01J 37/1477 (2013.01); H01J 37/222 (2013.01); H01J 37/244 (2013.01); H01J 2237/24495 (2013.01); H01J 2237/24535 (2013.01); H01J 2237/2802 (2013.01)] 21 Claims
OG exemplary drawing
 
1. A method of forming an image based on an electron event signal, the method comprising:
(a) providing an information threshold for a sample;
(b) collecting from an electron detector a number of events equal to the information threshold or determining that an event rate equal to the information threshold is achieved, wherein the electron detector is configured to collect an electron signal or an electron induced signal from the sample; and
(c) forming an image according to the electron signal or the electron induced signal.