US 12,237,006 B2
Memory device for performing read operation and program verification operation
Hyung Jin Choi, Gyeonggi-do (KR)
Assigned to SK hynix Inc., Gyeonggi-do (KR)
Filed by SK hynix Inc., Gyeonggi-do (KR)
Filed on Feb. 17, 2023, as Appl. No. 18/170,548.
Claims priority of application No. 10-2022-0140158 (KR), filed on Oct. 27, 2022.
Prior Publication US 2024/0144995 A1, May 2, 2024
Int. Cl. G11C 11/40 (2006.01); G11C 11/408 (2006.01); G11C 11/4094 (2006.01); G11C 11/4096 (2006.01)
CPC G11C 11/4096 (2013.01) [G11C 11/4085 (2013.01); G11C 11/4094 (2013.01)] 14 Claims
OG exemplary drawing
 
1. A memory device comprising:
a memory cell array including a plurality of memory cells;
a row control circuit coupled to the memory cells through a plurality of word lines and configured to apply, to a selected word line during read operations, respective read voltages having different levels;
a page buffer circuit coupled to the memory cells through a plurality of bit lines and configured to adjust, according to a sensing control signal during each of the read operations, an amount of current flowing through the bit lines to sense the adjusted amount; and
a read control circuit configured to adjust, during a second read operation subsequent to a first read operation among the read operations, a voltage level of the sensing control signal when a voltage level of a second read voltage corresponding to the second read operation is different from a level of a first read voltage corresponding to the first read operation.