US 12,236,572 B2
Inspection system for inspecting display device, display device for compensating for defective pixel and defective pixel compensation method
Mingyu Kim, Yongin-si (KR); Seyun Kim, Yongin-si (KR); Seungho Park, Yongin-si (KR); and Hyungwoo Yim, Yongin-si (KR)
Assigned to Samsung Display Co., Ltd., Yongin-si (KR)
Filed by Samsung Display Co., Ltd., Yongin-si (KR)
Filed on Mar. 5, 2024, as Appl. No. 18/596,017.
Claims priority of application No. 10-2023-0056014 (KR), filed on Apr. 28, 2023; and application No. 10-2023-0090547 (KR), filed on Jul. 12, 2023.
Prior Publication US 2024/0362766 A1, Oct. 31, 2024
Int. Cl. G06T 7/00 (2017.01); G09G 3/20 (2006.01)
CPC G06T 7/0004 (2013.01) [G09G 3/20 (2013.01); G06T 2207/30108 (2013.01); G09G 2320/0233 (2013.01); G09G 2330/10 (2013.01)] 21 Claims
OG exemplary drawing
 
1. An inspection system comprising:
a camera configured to capture a display device including a plurality of pixels and to provide a sensing image signal; and
an inspection device configured to receive the sensing image signal and to output a compensation signal for compensating for luminance of a defective pixel from among the plurality of pixels, the inspection device comprises:
an image detector configured to output a sensing input signal corresponding to the sensing image signal;
a defect coordinate detector configured to detect the defective pixel based on the sensing input signal and to output defect coordinates indicating a position of the defective pixel;
an image analyzer configured to analyze consistency of the defect coordinates based on the sensing image signal and the sensing input signal and to output final coordinates; and
a defect compensation calculator configured to output a compensation signal for adjusting luminance of compensation pixels adjacent to the defective pixel from among the plurality of pixels based on the final coordinates.