US 12,236,567 B2
Image evaluation method that can quantify images distorted by artifacts, computer program performing the method, and computing device
Seungwan Jeon, Hwaseong-si (KR); Kundong Kim, Seongnam-si (KR); Sungsu Kim, Yongin-si (JP); Daeil Yu, Seoul (KR); YuGyung Lee, Suwon-si (KR); and Joon-Seo Yim, Seoul (KR)
Assigned to SAMSUNG ELECTRONICS CO., LTD., Suwon-si (KR)
Filed by SAMSUNG ELECTRONICS CO., LTD., Suwon-si (KR)
Filed on Jul. 19, 2022, as Appl. No. 17/868,434.
Claims priority of application No. 10-2021-0113481 (KR), filed on Aug. 26, 2021; and application No. 10-2022-0002228 (KR), filed on Jan. 6, 2022.
Prior Publication US 2023/0060209 A1, Mar. 2, 2023
Int. Cl. G06T 7/00 (2017.01); G06T 5/20 (2006.01); G06T 5/70 (2024.01); G06T 7/11 (2017.01); G06T 7/37 (2017.01)
CPC G06T 7/0002 (2013.01) [G06T 5/20 (2013.01); G06T 5/70 (2024.01); G06T 7/11 (2017.01); G06T 7/37 (2017.01); G06T 2207/30168 (2013.01)] 21 Claims
OG exemplary drawing
 
1. An image evaluation method comprising:
obtaining a test image including a first lattice pattern formed by image edges;
aligning the test image using the image edges to generate an aligned image including a second lattice pattern formed by aligned image edges;
generating a compressed image by compressing the aligned image; and
generating a quantified result by quantifying a per-pixel difference between the compressed image and the aligned image.