| CPC G06F 30/367 (2020.01) [G06F 18/285 (2023.01); G06N 7/01 (2023.01); G06F 2119/06 (2020.01)] | 16 Claims |
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1. A method of generating a circuit model used to simulate an integrated circuit, the method comprising:
generating first feature element data and second feature element data by classifying feature data of a target semiconductor device according to measurement conditions, wherein the first feature element data and the second feature element data are based on feature elements independent to each other;
generating first target data and second target data by preprocessing the first feature element data and the second feature element data, respectively;
extracting a first machine learning model using the first target data and extracting a second machine learning model using the second target data; and
generating the circuit model used to simulate the integrated circuit by using the first machine learning model and the second machine learning model.
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